Lattice constant determination from Kossel patterns observed by CCD camera

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • E. Langer - , Chair of Microsystems, TUD Dresden University of Technology (Author)
  • S. Däbritz - , TUD Dresden University of Technology (Author)
  • C. Schurig - , TUD Dresden University of Technology (Author)
  • W. Hauffe - , TUD Dresden University of Technology (Author)

Abstract

The Kossel technique is known due to its precision for lattice constant determination in micro ranges by use of X-ray films. Recently we observed the Kossel interferences also by a CCD camera in a good quality. Thus, the diffraction interferences could be immediately processed and evaluated by computer permitting considerable time saving. In order to obtain the similar accuracy as for measurements with X-ray films further technical and experimental improvements were necessary, especially for a better contrast to observe intersection points of several weak reflections, for evaluating digital patterns, for optimizing of the shortest focus-screen distance and for considering the image field curvature of the objective. As a result, a precision in lattice constant determination could be achieved at a Fe-crystal coming relatively close to the one of comparable X-ray film patterns, which is still about one order of magnitude better for the time being.

Details

Original languageEnglish
Pages (from-to)45-48
Number of pages4
JournalApplied surface science
Volume179
Issue number1-4
Publication statusPublished - 16 Jul 2001
Peer-reviewedYes

Keywords

Keywords

  • CCD camera, Fe, Kossel technique, Lattice constant, Lattice source interferences