Lattice constant determination from Kossel patterns observed by CCD camera

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • E. Langer - , Professur für Mikrosystemtechnik, Technische Universität Dresden (Autor:in)
  • S. Däbritz - , Technische Universität Dresden (Autor:in)
  • C. Schurig - , Technische Universität Dresden (Autor:in)
  • W. Hauffe - , Technische Universität Dresden (Autor:in)

Abstract

The Kossel technique is known due to its precision for lattice constant determination in micro ranges by use of X-ray films. Recently we observed the Kossel interferences also by a CCD camera in a good quality. Thus, the diffraction interferences could be immediately processed and evaluated by computer permitting considerable time saving. In order to obtain the similar accuracy as for measurements with X-ray films further technical and experimental improvements were necessary, especially for a better contrast to observe intersection points of several weak reflections, for evaluating digital patterns, for optimizing of the shortest focus-screen distance and for considering the image field curvature of the objective. As a result, a precision in lattice constant determination could be achieved at a Fe-crystal coming relatively close to the one of comparable X-ray film patterns, which is still about one order of magnitude better for the time being.

Details

OriginalspracheEnglisch
Seiten (von - bis)45-48
Seitenumfang4
FachzeitschriftApplied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces
Jahrgang179
Ausgabenummer1-4
PublikationsstatusVeröffentlicht - 16 Juli 2001
Peer-Review-StatusJa

Schlagworte

Schlagwörter

  • CCD camera, Fe, Kossel technique, Lattice constant, Lattice source interferences