Kossel X-ray microdiffraction and EBSD as complementary methods in the SEM

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • E. Langer - , Chair of Microsystems, TUD Dresden University of Technology (Author)
  • S. Däbritz - , TUD Dresden University of Technology (Author)
  • W. Hauffe - , TUD Dresden University of Technology (Author)

Details

Original languageEnglish
Pages (from-to)114-115
Number of pages2
JournalMicroscopy and microanalysis
Volume9
Issue numberSUPPL. 3
Publication statusPublished - 2003
Peer-reviewedYes

Keywords

ASJC Scopus subject areas