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Investigations on residual strains and the cathodoluminescence and electron beam induced current signal of grain boundaries in silicon

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

M. Nacke - , TUD Dresden University of Technology (Author)
M. Allardt - , Chair of Semiconductor Physics (Author)
P. Chekhonin - , Chair of Metal Physics (Author)
E. Hieckmann - , Chair of Semiconductor Physics (Author)
W. Skrotzki - , Chair of Metal Physics (Author)
J. Weber - , Chair of Semiconductor Physics (Author)

Details

Original language	English
Article number	163511
Journal	Journal of Applied Physics
Volume	115
Issue number	16
Publication status	Published - 2014
Peer-reviewed	Yes

External IDs

Scopus	84900002943
researchoutputwizard	legacy.publication#57541

Keywords

Keywords

EBIC, Si, grain boundaries