Interfacial Distortion of Sb2Te3-Sb2Se3 Multilayers via Atomic Layer Deposition for Enhanced Thermoelectric Properties

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

Abstract

Atomic layer deposition (ALD) is an effective technique for depositing thin films with precise control of layer thickness and functional properties. In this work, Sb2Te3-Sb2Se3 nanostructures were synthesized using thermal ALD. A decrease in the Sb2Te3 layer thickness led to the emergence of distinct peaks from the Laue rings, indicative of a highly textured film structure with optimized crystallinity. Density functional theory simulations revealed that carrier redistribution occurs at the interface to establish charge equilibrium. By carefully optimizing the layer thicknesses, we achieved an obvious enhancement in the Seebeck coefficient, reaching a peak figure of merit (zT) value of 0.38 at room temperature. These investigations not only provide strong evidence for the potential of ALD manipulation to improve the electrical performance of metal chalcogenides but also offer valuable insights into achieving high performance in two-dimensional materials.

Details

Original languageEnglish
Pages (from-to)17500-17508
Number of pages9
JournalACS nano
Volume18
Issue number27
Early online date26 Jun 2024
Publication statusPublished - 9 Jul 2024
Peer-reviewedYes

External IDs

PubMed 38919047
ORCID /0000-0002-2438-0672/work/173051129

Keywords

Keywords

  • 2D materials, atomic layer deposition, interface engineering, SbTe−SbSe, transport property