Insights into the Temperature-Dependent Switching Behavior of Three-Gated Reconfigurable Field-Effect Transistors
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Three-gated reconfigurable field-effect transistors are innovative nanoelectronic devices that are rapidly and increasingly attracting substantial interest in several fields of application thanks to their inherent n/p-type reconfiguration capabilities. For this reason, it is of significant importance to acquire a deeper knowledge about the temperature ranges in which such devices can be operated and, at the same time, gather a better understanding of the physical mechanisms that are involved in their operation. To achieve this aim, in-depth observations about the functioning of such devices in an ultrawide temperature range, spanning from 80 to 475 K, are performed and are presented for their ambipolar and (Formula presented.) operation modes. In view of the data exhibited herein, it is possible to assess the performances of three-gated reconfigurable field-effect transistors within a considerable temperature span and finally provide significant insights on the temperature-dependent physical mechanisms regulating their functionality.
Details
Original language | English |
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Article number | 2300019 |
Number of pages | 9 |
Journal | Physica Status Solidi (A) Applications and Materials Science |
Volume | 220 |
Issue number | 13 |
Publication status | Published - 21 Apr 2023 |
Peer-reviewed | Yes |
External IDs
WOS | 000971567400001 |
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ORCID | /0000-0003-3814-0378/work/142256352 |
Keywords
Research priority areas of TU Dresden
DFG Classification of Subject Areas according to Review Boards
Subject groups, research areas, subject areas according to Destatis
ASJC Scopus subject areas
Keywords
- cryogenic electronics, high temperature, low temperature, reconfigurable field-effect transistors (RFETs), Schottky barrier, Cryogenic electronics, High temperature, Low temperature