INFLUENCE OF SURFACE-ROUGHNESS ON THE ELECTRICAL-PROPERTIES OF SI-SIO2 INTERFACES AND ON 2ND-HARMONIC GENERATION AT THESE INTERFACES

Research output: Other contributionOtherContributed

Contributors

  • CH BJORKMAN - (Author)
  • T YASUDA - (Author)
  • CE SHEARON - (Author)
  • Y MA - (Author)
  • G LUCOVSKY - (Author)
  • EMMERICHS, - (Author)
  • U, - (Author)
  • C MEYER - (Author)
  • H Kurz - (Author)
  • Karl Leo - , Chair of Opto-Electronics (Author)

Details

Original languageEnglish
Number of pages7
Volume11
Publication statusPublished - 1993
Peer-reviewedNo
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