Influence of sputtering pressure on microstructure and layer properties of iridium thin films
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
Original language | Undefined |
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Pages (from-to) | 41-46 |
Number of pages | 6 |
Journal | Thin solid films |
Volume | 662 |
Publication status | Published - 30 Sept 2018 |
Peer-reviewed | Yes |
Externally published | Yes |
External IDs
Scopus | 85050558180 |
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