Improving Technology Mapping for And-Inverter-Cones

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Abstract

AND-inverter-cones (AICs), proposed in 2012, offer a suitable alternative to Look-Up-Tables (LUTs) as the basic building block for FPGAs. They support tapping of multiple side outputs and are intrinsically fracturable which favours reduction of logic duplication. Unlike {k-inputs} LUTs, their area scales linearly with the number of inputs. Technology mapping is one of the crucial tasks to realize the full power of AIC-based FPGAs. However, the current state-of-the-art implementations suffers two main drawbacks as they do not account for the AIC properties fully: (i) The required time set for each node is suboptimal in the context of AIC and that impairs the mapping quality; (ii) they rely on priority cuts, which are unnecessarily runtime-intensive in the context of AIC mapping. To improve the mapping quality, we propose and proof a new method to calculate the maximal required time for each node purely based on its graph depth and height. We propose an asymptotically runtime-optimal in-memory direct cut selection method which leads to similar area numbers (~ 1% area overhead) as our reference priority cut implementation. Combining these improvements with a second area recovery round leads to a final area reduction of 16.4% and 3% for the MCNC and VTR benchmarks respectively as compared to our reference implementation of the latest known technology mapper, while leaving the delay unaltered.

Details

Original languageEnglish
Title of host publication2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
PublisherIEEE
Pages274-279
Number of pages6
ISBN (electronic)978-3-9819263-6-1
ISBN (print)978-1-6654-9637-7
Publication statusPublished - 14 Mar 2022
Peer-reviewedYes

Publication series

SeriesDesign, Automation and Test in Europe Conference and Exhibition (DATE)

Conference

Title2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Duration14 - 23 March 2022
CityVirtual, Online
CountryBelgium

External IDs

unpaywall 10.23919/date54114.2022.9774544