Improving Technology Mapping for And-Inverter-Cones
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
AND-inverter-cones (AICs), proposed in 2012, offer a suitable alternative to Look-Up-Tables (LUTs) as the basic building block for FPGAs. They support tapping of multiple side outputs and are intrinsically fracturable which favours reduction of logic duplication. Unlike {k-inputs} LUTs, their area scales linearly with the number of inputs. Technology mapping is one of the crucial tasks to realize the full power of AIC-based FPGAs. However, the current state-of-the-art implementations suffers two main drawbacks as they do not account for the AIC properties fully: (i) The required time set for each node is suboptimal in the context of AIC and that impairs the mapping quality; (ii) they rely on priority cuts, which are unnecessarily runtime-intensive in the context of AIC mapping. To improve the mapping quality, we propose and proof a new method to calculate the maximal required time for each node purely based on its graph depth and height. We propose an asymptotically runtime-optimal in-memory direct cut selection method which leads to similar area numbers (~ 1% area overhead) as our reference priority cut implementation. Combining these improvements with a second area recovery round leads to a final area reduction of 16.4% and 3% for the MCNC and VTR benchmarks respectively as compared to our reference implementation of the latest known technology mapper, while leaving the delay unaltered.
Details
Originalsprache | Englisch |
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Titel | 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Herausgeber (Verlag) | IEEE |
Seiten | 274-279 |
Seitenumfang | 6 |
ISBN (elektronisch) | 978-3-9819263-6-1 |
ISBN (Print) | 978-1-6654-9637-7 |
Publikationsstatus | Veröffentlicht - 14 März 2022 |
Peer-Review-Status | Ja |
Publikationsreihe
Reihe | Design, Automation and Test in Europe Conference and Exhibition (DATE) |
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Konferenz
Titel | 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 |
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Dauer | 14 - 23 März 2022 |
Stadt | Virtual, Online |
Land | Belgien |
Externe IDs
unpaywall | 10.23919/date54114.2022.9774544 |
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