Impact of Read Operation on the Performance of HfO2-Based Ferroelectric FETs
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Pages (from-to) | 1420-1423 |
| Number of pages | 4 |
| Journal | IEEE electron device letters |
| Volume | 41 |
| Issue number | 9 |
| Publication status | Published - Sept 2020 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 85091038387 |
|---|