Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Andreas Neff - , Leibniz Institute of Surface Engineering (Author)
  • Falk Niefind - , Leibniz Institute of Surface Engineering (Author)
  • Bernd Abel - , Leibniz Institute of Surface Engineering (Author)
  • Stefan C.B. Mannsfeld - , Chair of Organic Devices (cfaed) (Author)
  • Katrin R. Siefermann - , Leibniz Institute of Surface Engineering (Author)

Abstract

Photoemission electron microscopy in combination with polarized laser light is presented as a tool permitting direct imaging of polymer-chain orientation and local degree of order in semicrystalline samples of semiconducting polymers, a promising class of materials for future electronics. The key advantages of this imaging tool are its nondestructive and fast measurements, straightforward data analysis, the low complexity of sample preparation, and the possibility of performing measurements on a broad variety of technologically relevant substrates. The high spatial resolution of the microscope provides insights into the nanoscale morphology, which is relevant for the material's performance in electronic devices.

Details

Original languageEnglish
Article number1701012
JournalAdvanced materials
Volume29
Issue number29
Publication statusPublished - 4 Aug 2017
Peer-reviewedYes

External IDs

PubMed 28513882

Keywords

Research priority areas of TU Dresden

Keywords

  • imaging, morphology, photoemission electron microscopy, semiconducting polymers, semicrystalline