How to improve throughput in direct laser interference patterning: Top-hat beam profile and burst mode

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Abstract

This study describes the implementation of a top-hat pulsed laser for high-throughput structuring using Direct Laser Interference Patterning (DLIP). Using two and four laser beams, dot and line-like periodic surface structures were produced, respectively. The top-hat laser profile allows treating the surface of the target materials without the need to overlap the different laser pulses and thus being capable of reducing the processing time compared to Gaussian energy distributions. Similarly, using a burst of pulses, the ablation efficiency of the DLIP process could be significantly improved. Finally, ablation tests on stainless steel samples are presented and discussed.

Details

Original languageEnglish
Title of host publicationLaser-Based Micro- and Nanoprocessing XIV
EditorsUdo Klotzbach, Akira Watanabe, Rainer Kling
PublisherSPIE - The international society for optics and photonics
ISBN (electronic)9781510632998
Publication statusPublished - 2020
Peer-reviewedYes

Publication series

SeriesProceedings of SPIE - The International Society for Optical Engineering
Volume11268
ISSN0277-786X

Conference

TitleLaser-Based Micro- and Nanoprocessing XIV 2020
Duration3 - 6 February 2020
CitySan Francisco
CountryUnited States of America

External IDs

ORCID /0000-0003-4333-4636/work/196675515

Keywords

Keywords

  • Burst mode, Direct laser interference patterning, High-throughput, Top-hat