How to improve throughput in direct laser interference patterning: Top-hat beam profile and burst mode

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

Abstract

This study describes the implementation of a top-hat pulsed laser for high-throughput structuring using Direct Laser Interference Patterning (DLIP). Using two and four laser beams, dot and line-like periodic surface structures were produced, respectively. The top-hat laser profile allows treating the surface of the target materials without the need to overlap the different laser pulses and thus being capable of reducing the processing time compared to Gaussian energy distributions. Similarly, using a burst of pulses, the ablation efficiency of the DLIP process could be significantly improved. Finally, ablation tests on stainless steel samples are presented and discussed.

Details

OriginalspracheEnglisch
TitelLaser-Based Micro- and Nanoprocessing XIV
Redakteure/-innenUdo Klotzbach, Akira Watanabe, Rainer Kling
Herausgeber (Verlag)SPIE - The international society for optics and photonics
ISBN (elektronisch)9781510632998
PublikationsstatusVeröffentlicht - 2020
Peer-Review-StatusJa

Publikationsreihe

ReiheProceedings of SPIE - The International Society for Optical Engineering
Band11268
ISSN0277-786X

Konferenz

TitelLaser-Based Micro- and Nanoprocessing XIV 2020
Dauer3 - 6 Februar 2020
StadtSan Francisco
LandUSA/Vereinigte Staaten

Externe IDs

ORCID /0000-0003-4333-4636/work/196675515

Schlagworte

Schlagwörter

  • Burst mode, Direct laser interference patterning, High-throughput, Top-hat