High precision half-life measurement of Sm 147 α decay from thin-film sources
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Contributors
Abstract
An investigation of the α decay of Sm147 was performed using an ultra-low-background twin Frisch-grid ionization chamber (TF-GIC). Four natural samarium samples were produced using pulsed laser deposition in ultrahigh vacuum. The abundance of the Sm147 isotope was measured using inductively coupled plasma mass spectrometry. A combined half-life value for Sm147 of 1.079(26)×1011 yr was measured. A search for the α decay into the first excited state of Nd143 has been performed using γ spectroscopy, resulting in a lower half-life limit of T1/2>3.1×1018 yr (at 90% C.L.).
Details
| Original language | English |
|---|---|
| Article number | 034618 |
| Journal | Physical Review C |
| Volume | 95 |
| Issue number | 3 |
| Publication status | Published - 31 Mar 2017 |
| Peer-reviewed | Yes |