High precision half-life measurement of Sm 147 α decay from thin-film sources

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Contributors

  • H. Wilsenach - , Chair of Nuclear Physics, TUD Dresden University of Technology (Author)
  • K. Zuber - , Chair of Nuclear Physics, TUD Dresden University of Technology (Author)
  • D. Degering - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • R. Heller - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Volker Neu - , Leibniz Institute for Solid State and Materials Research Dresden (Author)

Abstract

An investigation of the α decay of Sm147 was performed using an ultra-low-background twin Frisch-grid ionization chamber (TF-GIC). Four natural samarium samples were produced using pulsed laser deposition in ultrahigh vacuum. The abundance of the Sm147 isotope was measured using inductively coupled plasma mass spectrometry. A combined half-life value for Sm147 of 1.079(26)×1011 yr was measured. A search for the α decay into the first excited state of Nd143 has been performed using γ spectroscopy, resulting in a lower half-life limit of T1/2>3.1×1018 yr (at 90% C.L.).

Details

Original languageEnglish
Article number034618
JournalPhysical Review C
Volume95
Issue number3
Publication statusPublished - 31 Mar 2017
Peer-reviewedYes

Keywords

ASJC Scopus subject areas