Glassy dynamics in nanometer thin layers of polystyrene
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Broadband Dielectric Spectroscopy (BDS) and Ellipsometry are combined to study the glassy dynamics of nanometric layers (>= 5 nm) of polystyrene. For the former, two types of sample arrangement are applied, that is, the conventional method where evaporated metal electrodes are used and a novel technique in which insulating silica nanostructures serve as spacers between highly conducting doped silicon counter electrodes. Within the limits of the experimental accuracy (+/- 2K) both approaches, BDS and Ellipsometry, deliver the coinciding result that - compared to the bulk - the glassy dynamics is not shifted. Furthermore the dielectric measurements do not indicate any broadening of the relaxation time distribution function, independent of the sample geometry employed.
Details
Original language | English |
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Pages (from-to) | 173-180 |
Number of pages | 8 |
Journal | European physical journal special topics : ST |
Volume | 189 |
Issue number | 1 |
Publication status | Published - Oct 2010 |
Peer-reviewed | Yes |
Externally published | Yes |
External IDs
Scopus | 78449235349 |
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ORCID | /0000-0002-4531-691X/work/148607819 |
Keywords
Keywords
- Ultrathin polymer-films, Transition temperature, Relaxations, Viscosity, Mobility, Oxide