Glassy dynamics in nanometer thin layers of polystyrene

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • E. U. Mapesa - , University Hospital Leipzig (Author)
  • M. Erber - , Leibniz Institute of Polymer Research Dresden (Author)
  • M. Tress - , University Hospital Leipzig (Author)
  • K. -J. Eichhorn - , Leibniz Institute of Polymer Research Dresden (Author)
  • A. Serghei - , University of Massachusetts Amherst (Author)
  • B. Voit - , Leibniz Institute of Polymer Research Dresden (Author)
  • F. Kremer - , University Hospital Leipzig (Author)

Abstract

Broadband Dielectric Spectroscopy (BDS) and Ellipsometry are combined to study the glassy dynamics of nanometric layers (>= 5 nm) of polystyrene. For the former, two types of sample arrangement are applied, that is, the conventional method where evaporated metal electrodes are used and a novel technique in which insulating silica nanostructures serve as spacers between highly conducting doped silicon counter electrodes. Within the limits of the experimental accuracy (+/- 2K) both approaches, BDS and Ellipsometry, deliver the coinciding result that - compared to the bulk - the glassy dynamics is not shifted. Furthermore the dielectric measurements do not indicate any broadening of the relaxation time distribution function, independent of the sample geometry employed.

Details

Original languageEnglish
Pages (from-to)173-180
Number of pages8
JournalEuropean physical journal special topics : ST
Volume189
Issue number1
Publication statusPublished - Oct 2010
Peer-reviewedYes
Externally publishedYes

External IDs

Scopus 78449235349
ORCID /0000-0002-4531-691X/work/148607819

Keywords

Keywords

  • Ultrathin polymer-films, Transition temperature, Relaxations, Viscosity, Mobility, Oxide