Exploiting diffusion currents at Ohmic contacts for trap characterization in organic semiconductors

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

Details

Original languageEnglish
Pages (from-to)2428-2432
JournalOrganic electronics
Volume15
Issue number10
Publication statusPublished - Oct 2014
Peer-reviewedYes

External IDs

Scopus 84905171037
ORCID /0000-0002-9773-6676/work/142247035

Keywords

Keywords

  • Drift-diffusion simulation, Space-charge limited currents, Mobility, Traps, Exponential distribution

Library keywords