Electrical stress on transparent conductive oxide layer

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Contributors

  • Detlef Bonfert - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Dieter Hemmetzberger - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Gerhard Klink - , Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT) (Author)
  • Karlheinz Bock - , Chair of Electronic Packaging Technology, Fraunhofer Research Institution for Microsystems and Solid State Technologies (EMFT), Technical University of Munich (Author)
  • Paul Svasta - , Polytechnic University of Bucharest (Author)
  • Ciprian Ionescu - , Polytechnic University of Bucharest (Author)

Abstract

Transparent conductive oxides (TCO) are a class of materials with good electrical conductivity and low visible light absorption. Their properties can be tuned by additional doping and by deposition techniques. In this way their applications are as active and passive electronic and opto-electronic devices. In this paper we present the electrical properties of an antimony doped tin oxide (ATO) layer deposited by screen printing techniques in a roll-to-roll process. We focus on the DC-and pulsed behavior of this conductive layer on flexible substrates and the resulting changes of his resistive properties under normal and stressed conditions.

Details

Original languageGerman
Title of host publicationProceedings of the 36th International Spring Seminar on Electronics Technology
PublisherIEEE
Pages109-114
Number of pages6
ISBN (print)978-1-4799-0036-7
Publication statusPublished - 12 May 2013
Peer-reviewedYes

Conference

Title2013 36th International Spring Seminar on Electronics Technology
SubtitleAutomotive Electronics
Abbreviated titleISSE 2013
Duration8 - 12 May 2013
LocationParc Hotel
CityAlba Iulia
CountryRomania

External IDs

Scopus 84891310346
ORCID /0000-0002-0757-3325/work/139064849

Keywords

Keywords

  • Positron emission tomography, Resistance, Resistors, Stress, Heating, Electrical resistance measurement, Current measurement