Electric potential mapping by thickness variation: A new method for model-free mobility determination in organic semiconductor thin films
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Pages (from-to) | 3460-3471 |
| Number of pages | 12 |
| Journal | Organic electronics |
| Volume | 14 |
| Issue number | 12 |
| Publication status | Published - 17 Sept 2013 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 84888288254 |
|---|
Keywords
Keywords
- Organic semiconductors, Charge transport, Mobility, Thin films, Blend layers, Organic Solar Cells