Effect of film thickness, type of buffer layer, and substrate temperature on the morphology of dicyanovinyl-substituted sexithiophene films
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
Original language | English |
---|---|
Pages (from-to) | 2479-2487 |
Journal | Thin solid films |
Volume | 520 |
Issue number | 7 |
Publication status | Published - 31 Jan 2012 |
Peer-reviewed | Yes |
External IDs
Scopus | 84856371239 |
---|
Keywords
Keywords
- X-ray diffraction, X-ray reflectivity, Crystallite, Organic semiconductor, Sexithiophene