Effect of film thickness, type of buffer layer, and substrate temperature on the morphology of dicyanovinyl-substituted sexithiophene films
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Pages (from-to) | 2479-2487 |
| Journal | Thin solid films |
| Volume | 520 |
| Issue number | 7 |
| Publication status | Published - 31 Jan 2012 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 84856371239 |
|---|
Keywords
Keywords
- X-ray diffraction, X-ray reflectivity, Crystallite, Organic semiconductor, Sexithiophene