Effect of film thickness, type of buffer layer, and substrate temperature on the morphology of dicyanovinyl-substituted sexithiophene films

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

Details

Original languageEnglish
Pages (from-to)2479-2487
JournalThin solid films
Volume520
Issue number7
Publication statusPublished - 31 Jan 2012
Peer-reviewedYes

External IDs

Scopus 84856371239

Keywords

Keywords

  • X-ray diffraction, X-ray reflectivity, Crystallite, Organic semiconductor, Sexithiophene