Determining the C60 molecular arrangement in thin films by means of X-ray diffraction
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
| Original language | English |
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| Pages (from-to) | 983-990 |
| Number of pages | 8 |
| Journal | Journal of Applied Crystallography |
| Volume | 44 |
| Issue number | Part 5 |
| Publication status | Published - 2011 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 80052999202 |
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