Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

  • Taro Niiyama - , Tokyo Keizai University (Author)
  • Piao Zhe - , Tokyo Keizai University (Author)
  • Koichi Ishida - , Chair of Circuit Design and Network Theory, Tokyo Keizai University (Author)
  • Masami Murakata - , Tokyo University of Agriculture (Author)
  • Makoto Takamiya - , Tokyo Keizai University (Author)
  • Takayasu Sakurai - , Tokyo Keizai University (Author)

Abstract

The minimum operating voltage (VDDmin) of 90-nm CMOS ring oscillators (RO's) is investigated in order to clarify the lower limit of supply voltage (VDD) for logic circuits. The measured VDDmin is determined by the intra-die threshold voltage random variations and increased from 91 mV to 224 mV when the number of RO stages increased from 11 to 1001, which hinders the VDD scaling. Lowering VDDmin is difficult, since it would require an impractical inverter-by-inverter adaptive body bias control. Therefore, the fine-grain adaptive VDD control will be more effective for the ultra low voltage logic circuits to reduce the power consumption.

Details

Original languageEnglish
Title of host publication9th International Symposium on Quality Electronic Design (isqed 2008)
PublisherIEEE
Pages133-136
Number of pages4
ISBN (print)978-0-7695-3117-5
Publication statusPublished - 19 Mar 2008
Peer-reviewedYes

Conference

Title9th International Symposium on Quality Electronic Design (isqed 2008)
Duration17 - 19 March 2008
LocationSan Jose, CA, USA

External IDs

Scopus 49749084887
ORCID /0000-0002-4152-1203/work/165453389

Keywords

Sustainable Development Goals

Keywords

  • Voltage-controlled oscillators, Logic circuits, Programmable control, Adaptive control, CMOS logic circuits, Ring oscillators, Threshold voltage, Voltage control, Low voltage, Energy consumption