Dependence of Minimum Operating Voltage (VDDmin) on Block Size of 90-nm CMOS Ring Oscillators and its Implications in Low Power DFM

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Taro Niiyama - , Tokyo Keizai University (Autor:in)
  • Piao Zhe - , Tokyo Keizai University (Autor:in)
  • Koichi Ishida - , Professur für Schaltungstechnik und Netzwerktheorie, Tokyo Keizai University (Autor:in)
  • Masami Murakata - , Tokyo University of Agriculture (Autor:in)
  • Makoto Takamiya - , Tokyo Keizai University (Autor:in)
  • Takayasu Sakurai - , Tokyo Keizai University (Autor:in)

Abstract

The minimum operating voltage (VDDmin) of 90-nm CMOS ring oscillators (RO's) is investigated in order to clarify the lower limit of supply voltage (VDD) for logic circuits. The measured VDDmin is determined by the intra-die threshold voltage random variations and increased from 91 mV to 224 mV when the number of RO stages increased from 11 to 1001, which hinders the VDD scaling. Lowering VDDmin is difficult, since it would require an impractical inverter-by-inverter adaptive body bias control. Therefore, the fine-grain adaptive VDD control will be more effective for the ultra low voltage logic circuits to reduce the power consumption.

Details

OriginalspracheEnglisch
Titel9th International Symposium on Quality Electronic Design (isqed 2008)
Herausgeber (Verlag)IEEE
Seiten133-136
Seitenumfang4
ISBN (Print)978-0-7695-3117-5
PublikationsstatusVeröffentlicht - 19 März 2008
Peer-Review-StatusJa

Konferenz

Titel9th International Symposium on Quality Electronic Design (isqed 2008)
Dauer17 - 19 März 2008
OrtSan Jose, CA, USA

Externe IDs

Scopus 49749084887
ORCID /0000-0002-4152-1203/work/165453389

Schlagworte

Ziele für nachhaltige Entwicklung

Schlagwörter

  • Voltage-controlled oscillators, Logic circuits, Programmable control, Adaptive control, CMOS logic circuits, Ring oscillators, Threshold voltage, Voltage control, Low voltage, Energy consumption