Comparative Study of the Long-term Reliability of HTLS Conductor Systems

Research output: Contribution to conferences › Paper › Contributed

Contributors

  • W. Kiewitt - (Author)
  • R. Bardl - (Author)
  • Christian Kühnel - (Author)
  • D. Loudon - (Author)
  • D. Stengel - (Author)

Details

Original languageEnglish
Pages1-10
Number of pages10
Publication statusPublished - 2018
Peer-reviewedNo

Keywords

Keywords

  • High temperature low sag conductors (HTLS), conductor grease, mechanical and electrical tests, ageing, reliability, joint resistance, stress-strain