CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems.

Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review

Contributors

Details

Original languageUndefined
Title of host publicationVLSI Design
Pages307-312
Number of pages6
Publication statusPublished - 2018
Peer-reviewedYes

External IDs

Scopus 85046741499

Keywords

Research priority areas of TU Dresden