Classification of Photo-Acoustic Emission in Direct Laser Interference Pattering for Identifying the Spatial Period

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Tobias Steege - , Fraunhofer Institute for Material and Beam Technology (Author)
  • Adrian Belkin - , Fraunhofer Institute for Material and Beam Technology (Author)
  • Christoph Zwahr - , Fraunhofer Institute for Material and Beam Technology (Author)
  • Andres F. Lasagni - , Chair of Laser-based Manufacturing, Fraunhofer Institute for Material and Beam Technology (Author)

Abstract

Direct Laser Interference Patterning (DLIP) is a versatile tool used to produce microstructures for functionalized surfaces on different materials. However, monitoring strategies are needed to ensure repeatability and quality control during the fabrication of surface patterns with micro- and submicron resolution features. This study proposes a new approach for identifying the spatial period on the surface using airborne acoustic emission during DLIP. The acoustic emission parameters from a single laser pulse on the material are analyzed using different prediction algorithms to classify and compare different spatial periods. Line-like patterns were produced on aluminum substrates using a pulsed laser source, and the laser fluence was varied to obtain variation in the data set. The preliminary results show that the four algorithms can detect and identify the spatial period for different laser fluences with an accuracy of up to 96%. This approach could be used for an automated setup workflow and eliminates the need for manual measurement of this parameter. It is an important step towards a fully automated initialization of surface processing in the micrometer range.

Details

Original languageEnglish
Pages (from-to)34-39
Number of pages6
JournalJournal of laser micro nanoengineering
Volume19
Issue number1
Publication statusPublished - Feb 2024
Peer-reviewedYes

External IDs

Scopus 85194500112

Keywords

Keywords

  • Acoustic emission, Direct Laser Interference Patterning (DLIP), Functionalized surfaces, Microstructures, Monitoring strategies, Prediction algorithms