Charge storage in silicon-implanted silicondioxide layers examined by scanning probe microscopy
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Details
| Original language | English |
|---|---|
| Pages (from-to) | 159-165 |
| Number of pages | 7 |
| Journal | Thin Solid Films |
| Volume | 513 |
| Issue number | 1-2 |
| Publication status | Published - Aug 2006 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 33745269772 |
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