Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Dimitra Gkogkou - , Leibniz-Institut für Analytische Wissenschaften - ISAS, Technical University of Berlin, Humboldt University of Berlin (Author)
  • Timur Shaykhutdinov - , Leibniz-Institut für Analytische Wissenschaften - ISAS (Author)
  • Thomas W.H. Oates - , Leibniz-Institut für Analytische Wissenschaften - ISAS (Author)
  • Ulrich Gernert - , Technical University of Berlin (Author)
  • Benjamin Schreiber - , Helmholtz-Zentrum Dresden-Rossendorf (Author)
  • Stefan Facsko - , Helmholtz-Zentrum Dresden-Rossendorf (Author)
  • Peter Hildebrandt - , Technical University of Berlin (Author)
  • Inez M. Weidinger - , Technical University of Berlin (Author)
  • Norbert Esser - , Leibniz-Institut für Analytische Wissenschaften - ISAS (Author)
  • Karsten Hinrichs - , Leibniz-Institut für Analytische Wissenschaften - ISAS (Author)

Abstract

The present investigation aims to study the optical response of anisotropic Ag nanoparticle arrays deposited on rippled silicon substrates by performing a qualitative comparison between experimental and theoretical results. Spectroscopic ellipsometry was used along with numerical calculations using finite-difference time-domain (FDTD) method and rigorous coupled wave analysis (RCWA) to reveal trends in the optical and geometrical properties of the nanoparticle array. Ellipsometric data show two resonances, in the orthogonal x and y directions, that originate from localized plasmon resonances as demonstrated by the calculated near-fields from FDTD calculations. The far-field calculations by RCWA point to decoupled resonances in x direction and possible coupling effects in y direction, corresponding to the short and long axis of the anisotropic nanoparticles, respectively.

Details

Original languageEnglish
Pages (from-to)460-464
Number of pages5
JournalApplied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces
Volume421
Publication statusPublished - 1 Nov 2017
Peer-reviewedYes
Externally publishedYes

Keywords

Keywords

  • Anisotropy, FDTD, Nanostructure characterization, Optical modeling, RCWA, Spectroscopic ellipsometry