Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • Dimitra Gkogkou - , Leibniz-Institut für Analytische Wissenschaften -ISAS- e.V., Technische Universität Berlin, Humboldt-Universität zu Berlin (Autor:in)
  • Timur Shaykhutdinov - , Leibniz-Institut für Analytische Wissenschaften -ISAS- e.V. (Autor:in)
  • Thomas W.H. Oates - , Leibniz-Institut für Analytische Wissenschaften -ISAS- e.V. (Autor:in)
  • Ulrich Gernert - , Technische Universität Berlin (Autor:in)
  • Benjamin Schreiber - , Helmholtz-Zentrum Dresden-Rossendorf (Autor:in)
  • Stefan Facsko - , Helmholtz-Zentrum Dresden-Rossendorf (Autor:in)
  • Peter Hildebrandt - , Technische Universität Berlin (Autor:in)
  • Inez M. Weidinger - , Technische Universität Berlin (Autor:in)
  • Norbert Esser - , Leibniz-Institut für Analytische Wissenschaften -ISAS- e.V. (Autor:in)
  • Karsten Hinrichs - , Leibniz-Institut für Analytische Wissenschaften -ISAS- e.V. (Autor:in)

Abstract

The present investigation aims to study the optical response of anisotropic Ag nanoparticle arrays deposited on rippled silicon substrates by performing a qualitative comparison between experimental and theoretical results. Spectroscopic ellipsometry was used along with numerical calculations using finite-difference time-domain (FDTD) method and rigorous coupled wave analysis (RCWA) to reveal trends in the optical and geometrical properties of the nanoparticle array. Ellipsometric data show two resonances, in the orthogonal x and y directions, that originate from localized plasmon resonances as demonstrated by the calculated near-fields from FDTD calculations. The far-field calculations by RCWA point to decoupled resonances in x direction and possible coupling effects in y direction, corresponding to the short and long axis of the anisotropic nanoparticles, respectively.

Details

OriginalspracheEnglisch
Seiten (von - bis)460-464
Seitenumfang5
FachzeitschriftApplied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces
Jahrgang421
PublikationsstatusVeröffentlicht - 1 Nov. 2017
Peer-Review-StatusJa
Extern publiziertJa

Schlagworte

Schlagwörter

  • Anisotropy, FDTD, Nanostructure characterization, Optical modeling, RCWA, Spectroscopic ellipsometry