Characterization of anisotropically shaped silver nanoparticle arrays via spectroscopic ellipsometry supported by numerical optical modeling
Publikation: Beitrag in Fachzeitschrift › Forschungsartikel › Beigetragen › Begutachtung
Beitragende
Abstract
The present investigation aims to study the optical response of anisotropic Ag nanoparticle arrays deposited on rippled silicon substrates by performing a qualitative comparison between experimental and theoretical results. Spectroscopic ellipsometry was used along with numerical calculations using finite-difference time-domain (FDTD) method and rigorous coupled wave analysis (RCWA) to reveal trends in the optical and geometrical properties of the nanoparticle array. Ellipsometric data show two resonances, in the orthogonal x and y directions, that originate from localized plasmon resonances as demonstrated by the calculated near-fields from FDTD calculations. The far-field calculations by RCWA point to decoupled resonances in x direction and possible coupling effects in y direction, corresponding to the short and long axis of the anisotropic nanoparticles, respectively.
Details
Originalsprache | Englisch |
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Seiten (von - bis) | 460-464 |
Seitenumfang | 5 |
Fachzeitschrift | Applied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces |
Jahrgang | 421 |
Publikationsstatus | Veröffentlicht - 1 Nov. 2017 |
Peer-Review-Status | Ja |
Extern publiziert | Ja |
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Anisotropy, FDTD, Nanostructure characterization, Optical modeling, RCWA, Spectroscopic ellipsometry