A zoom into the nanoscale texture of secondary cell walls

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • Tobias Keplinger - (Author)
  • Johannes Konnerth - (Author)
  • Veronique Aguie-Beghin - (Author)
  • Markus Rüggeberg - , ETH Zurich, Swiss Federal Laboratories for Materials Science and Technology (Empa) (Author)
  • Notburga Gierlinger - (Author)
  • Ingo Burgert - (Author)

Details

Original languageEnglish
JournalPlant methods
Volume10
Publication statusPublished - 10 Jan 2014
Peer-reviewedYes
Externally publishedYes

External IDs

Scopus 84892394453
ORCID /0000-0002-6966-8311/work/142254821

Keywords

Keywords

  • Secondary cell walls, Scanning near field optical microscopy, Atomic force microscopy, Diffraction limit, Lignification