A voltage-reference-free pulse density modulation (VRF-PDM) 1-V input switched-capacitor 1/2 voltage converter with output voltage trimming by hot carrier injection and periodic activation scheme

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • Xin Zhang - , Chair of Physical Chemistry, Tokyo University of Agriculture (Author)
  • Yu Pu - , Tokyo University of Agriculture (Author)
  • Koichi Ishida - , Chair of Circuit Design and Network Theory, Tokyo University of Agriculture (Author)
  • Yoshikatsu Ryu - , Semiconductor Technology Academic Research Center (STARC) (Author)
  • Yasuyuki Okuma - , Semiconductor Technology Academic Research Center (STARC) (Author)
  • Po-Hung Chen - , Tokyo University of Agriculture (Author)
  • Kazunori Watanabe - , Semiconductor Technology Academic Research Center (STARC) (Author)
  • Takayasu Sakurai - , Tokyo University of Agriculture (Author)
  • Makoto Takamiya - , Tokyo University of Agriculture (Author)

Abstract

A 1-V input, 0.45-V output switched-capacitor (SC) 2:1 voltage converter is developed in 65-nm CMOS. A proposed voltage-reference-free pulse density modulation (VRF-PDM) increased the efficiency from 17% to 73% at 50-μA output current by reducing the pulse density and eliminating the voltage reference circuit. An output voltage trimming by the hot carrier injection to a comparator and a periodic activation scheme of the SC converter are also proposed to solve the problems attributed to VRF-PDM.

Details

Original languageEnglish
Title of host publication2011 Symposium on VLSI Circuits - Digest of Technical Papers
PublisherIEEE
Pages280-281
Number of pages2
ISBN (print)978-4-86348-166-4
Publication statusPublished - 17 Jun 2011
Peer-reviewedYes

Conference

Title2011 Symposium on VLSI Circuits - Digest of Technical Papers
Duration15 - 17 June 2011
LocationKyoto, Japan

External IDs

Scopus 80052669888
ORCID /0000-0002-4152-1203/work/165453416

Keywords

Keywords

  • Human computer interaction, Voltage measurement, Modulation, Switches, Pulse measurements, Density measurement, Hot carrier injection