A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • T. Ali - (Author)
  • K. Kuehnel - (Author)
  • M. Czernohorsky - (Author)
  • C. Mart - (Author)
  • M. Rudolph - (Author)
  • B. Paetzold - (Author)
  • D. Lehninger - (Author)
  • R. Olivo - (Author)
  • M. Lederer - (Author)
  • F. Mueller - (Author)
  • R. Hoffmann - (Author)
  • J. Metzger - (Author)
  • R. Binder - (Author)
  • P. Steinke - (Author)
  • T. Kaempfe - (Author)
  • J. Mueller - (Author)
  • K. Seidel - (Author)
  • L. M. Eng - (Author)

Details

Original languageEnglish
Pages (from-to)2981-2987
Number of pages7
JournalIEEE transactions on electron devices : ED
Issue number7
Publication statusPublished - 2020
Peer-reviewedYes

External IDs

Scopus 85087329268

Keywords