A stretchable EMI measurement sheet with 8×8 coil array, 2V organic CMOS decoder, and −70dBm EMI detection circuits in 0.18¼m CMOS

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • Koichi Ishida - , Chair of Circuit Design and Network Theory, Tokyo University of Agriculture (Author)
  • Naoki Masunaga - , Tokyo University of Agriculture (Author)
  • Zhiwei Zhou - , Tokyo University of Agriculture (Author)
  • Tadashi Yasufuku - , Tokyo University of Agriculture (Author)
  • Tsuyoshi Sekitani - , Tokyo University of Agriculture (Author)
  • Ute Zschieschang - , Max Planck Institute for Solid State Research (Author)
  • Hagen Klauk - , Max Planck Institute for Solid State Research (Author)
  • Makoto Takamiya - , Tokyo University of Agriculture (Author)
  • Takao Someya - , Tokyo University of Agriculture (Author)
  • Takayasu Sakurai - , Tokyo University of Agriculture (Author)

Abstract

Electromagnetic interference (EMI) is a serious issue degrading the dependability of electronic devices. The issue is complicated by the following technology trends: 1) RF signals and clock pulses of digital ICs are in the same frequency range. 2) The increase of LSI power consumption causes an increase of noise emission. 3) Electronic devices have 3D-structures and packaging is dense. These trends also make the root cause analysis of EMI difficult. For example, it is difficult to find the EMI generation points in electronic devices such as cell-phones and PDAs.

Details

Original languageEnglish
Title of host publication2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages472-473
Number of pages2
ISBN (print)978-1-4244-3458-9
Publication statusPublished - 12 Feb 2009
Peer-reviewedYes

Conference

Title2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers
Duration8 - 12 February 2009
LocationSan Francisco, CA, USA

External IDs

Scopus 70349291206
ORCID /0000-0002-4152-1203/work/165453395

Keywords

Keywords

  • Electromagnetic interference, Coils, Decoding, Circuits, Electromagnetic measurements, Thermal degradation, CMOS technology, Clocks, Frequency, Large scale integration