A novel topology to characterize high voltage IGBTs in a soft switching converter

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Contributors

Abstract

Characterizing high voltage IGBTs in a soft switching series resonance converter usually involves building a test bench that incorporates bulky and expensive power supplies. In this paper a test circuit employing a novel operation mode, the so called quasi-steady mode, is introduced which allows the investigation of the semiconductors at low expense of power supplies.

Details

Original languageGerman
Title of host publication2011 Semiconductor Conference Dresden
PublisherIEEE Computational Intelligence Society (CIS)
Pages1-4
Number of pages4
ISBN (print)978-1-4577-0429-1
Publication statusPublished - 28 Sept 2011
Peer-reviewedYes

Conference

Title2011 Semiconductor Conference Dresden
Duration27 - 28 September 2011
LocationDresden, Germany

External IDs

Scopus 82155163927

Keywords

Keywords

  • Insulated gate bipolar transistors, Power supplies, Switches, Capacitors, Bridge circuits, Inductance, Resistors