A novel topology to characterize high voltage IGBTs in a soft switching converter
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
Characterizing high voltage IGBTs in a soft switching series resonance converter usually involves building a test bench that incorporates bulky and expensive power supplies. In this paper a test circuit employing a novel operation mode, the so called quasi-steady mode, is introduced which allows the investigation of the semiconductors at low expense of power supplies.
Details
Originalsprache | Deutsch |
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Titel | 2011 Semiconductor Conference Dresden |
Herausgeber (Verlag) | IEEE Computational Intelligence Society (CIS) |
Seiten | 1-4 |
Seitenumfang | 4 |
ISBN (Print) | 978-1-4577-0429-1 |
Publikationsstatus | Veröffentlicht - 28 Sept. 2011 |
Peer-Review-Status | Ja |
Konferenz
Titel | 2011 Semiconductor Conference Dresden |
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Dauer | 27 - 28 September 2011 |
Ort | Dresden, Germany |
Externe IDs
Scopus | 82155163927 |
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Schlagworte
Schlagwörter
- Insulated gate bipolar transistors, Power supplies, Switches, Capacitors, Bridge circuits, Inductance, Resistors