A New In Situ Microscopy Approach to Study the Degradation and Failure Mechanisms of Time-Dependent Dielectric Breakdown: Set-Up and Opportunities

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

Zhongquan Liao - , Chair of Materials Science and Nanotechnology (Author)
Martin Gall - (Author)
Kong Boon Yeap - (Author)
Christoph Sander - (Author)
Oliver Aubel - (Author)
Uwe Mühle - , Chair of Powder Metallurgy, Sintering, and Composite Materials (Author)
Jürgen Gluch - , Chair of Materials Science and Nanotechnology (Author)
Sven Niese - , Dresden Center for Nanoanalysis (DCN) (Author)
Yvonne Standke - (Author)
Rüdiger Rosenkranz - (Author)
Markus Löffler - , Dresden Center for Nanoanalysis (DCN) (Author)
Norman Vogel - (Author)
Armand Beyer - (Author)
Hans-Jürgen Engelmann - (Author)
Peter Guttmann - (Author)
Gerd Schneider - (Author)
Ehrenfried Zschech - (Author)

Original language	English
Pages (from-to)	486-493
Number of pages	8
Journal	Advanced engineering materials
Volume	16
Issue number	5
Publication status	Published - 2014
Peer-reviewed	Yes

Scopus	84901428675