A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS
Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review
Contributors
Abstract
A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.
Details
| Original language | English |
|---|---|
| Title of host publication | 2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 109-110 |
| Number of pages | 2 |
| ISBN (print) | 978-1-4673-3028-2 |
| Publication status | Published - 25 Jan 2013 |
| Peer-reviewed | Yes |
Conference
| Title | 18th Asia and South Pacific Design Automation Conference |
|---|---|
| Abbreviated title | ASP-DAC 2013 |
| Conference number | 18 |
| Duration | 22 - 25 January 2013 |
| City | Yokohama |
| Country | Japan |
External IDs
| Scopus | 84877726704 |
|---|---|
| ORCID | /0000-0002-4152-1203/work/165453431 |
Keywords
Keywords
- Delays, Pulse width modulation, Clocks, Logic gates, DC-DC power converters, Delay lines, Stress