A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

  • Xin Zhang - , Chair of Physical Chemistry, Tokyo University of Agriculture (Author)
  • Po-Hung Chen - , Tokyo University of Agriculture (Author)
  • Yoshikatsu Ryu - , Semiconductor Technology Academic Research Center (STARC) (Author)
  • Koichi Ishida - , Chair of Circuit Design and Network Theory, Tokyo University of Agriculture (Author)
  • Yasuyuki Okuma - , Semiconductor Technology Academic Research Center (STARC) (Author)
  • Kazunori Watanabe - , Semiconductor Technology Academic Research Center (STARC) (Author)
  • Takayasu Sakurai - , Tokyo University of Agriculture (Author)
  • Makoto Takamiya - , Tokyo University of Agriculture (Author)

Abstract

A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.

Details

Original languageEnglish
Title of host publication2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages109-110
Number of pages2
ISBN (print)978-1-4673-3028-2
Publication statusPublished - 25 Jan 2013
Peer-reviewedYes

Conference

Title18th Asia and South Pacific Design Automation Conference
Abbreviated titleASP-DAC 2013
Conference number18
Duration22 - 25 January 2013
CityYokohama
CountryJapan

External IDs

Scopus 84877726704
ORCID /0000-0002-4152-1203/work/165453431

Keywords

Keywords

  • Delays, Pulse width modulation, Clocks, Logic gates, DC-DC power converters, Delay lines, Stress