A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.
Details
| Originalsprache | Englisch |
|---|---|
| Titel | 2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers (IEEE) |
| Seiten | 109-110 |
| Seitenumfang | 2 |
| ISBN (Print) | 978-1-4673-3028-2 |
| Publikationsstatus | Veröffentlicht - 25 Jan. 2013 |
| Peer-Review-Status | Ja |
Konferenz
| Titel | 18th Asia and South Pacific Design Automation Conference |
|---|---|
| Kurztitel | ASP-DAC 2013 |
| Veranstaltungsnummer | 18 |
| Dauer | 22 - 25 Januar 2013 |
| Stadt | Yokohama |
| Land | Japan |
Externe IDs
| Scopus | 84877726704 |
|---|---|
| ORCID | /0000-0002-4152-1203/work/165453431 |
Schlagworte
Schlagwörter
- Delays, Pulse width modulation, Clocks, Logic gates, DC-DC power converters, Delay lines, Stress