A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Xin Zhang - , Professur für Physikalische Chemie, Tokyo University of Agriculture (Autor:in)
  • Po-Hung Chen - , Tokyo University of Agriculture (Autor:in)
  • Yoshikatsu Ryu - , Semiconductor Technology Academic Research Center (STARC) (Autor:in)
  • Koichi Ishida - , Professur für Schaltungstechnik und Netzwerktheorie, Tokyo University of Agriculture (Autor:in)
  • Yasuyuki Okuma - , Semiconductor Technology Academic Research Center (STARC) (Autor:in)
  • Kazunori Watanabe - , Semiconductor Technology Academic Research Center (STARC) (Autor:in)
  • Takayasu Sakurai - , Tokyo University of Agriculture (Autor:in)
  • Makoto Takamiya - , Tokyo University of Agriculture (Autor:in)

Abstract

A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.

Details

OriginalspracheEnglisch
Titel2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
Seiten109-110
Seitenumfang2
ISBN (Print)978-1-4673-3028-2
PublikationsstatusVeröffentlicht - 25 Jan. 2013
Peer-Review-StatusJa

Konferenz

Titel18th Asia and South Pacific Design Automation Conference
KurztitelASP-DAC 2013
Veranstaltungsnummer18
Dauer22 - 25 Januar 2013
StadtYokohama
LandJapan

Externe IDs

Scopus 84877726704
ORCID /0000-0002-4152-1203/work/165453431

Schlagworte

Schlagwörter

  • Delays, Pulse width modulation, Clocks, Logic gates, DC-DC power converters, Delay lines, Stress