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IEEE design & test : D & T

ISSNs: 2168-2356, 0740-7475

Additional searchable ISSN (electronic): 1558-1918, 2168-2364

IEEE, New York [u. a.], United States of America

Scopus rating (2023): CiteScore 3.8 SJR 0.489 SNIP 0.757

Journal

Titles
  • IEEE design & test : D & T(2013 → …)
  • IEEE design & test of computers : D & T(19842012)
ISSNs2168-2356, 0740-7475
Additional searchable ISSN (electronic)1558-1918, 2168-2364
PublisherIEEE, New York [u. a.]
Country/TerritoryUnited States of America
ZDB-ID2729075-X
ZDB-ID2714080-5

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