IEEE design & test : D & T

ISSNs: 2168-2356, 0740-7475

Additional searchable ISSN (electronic): 1558-1918, 2168-2364

IEEE Computer Society, United States of America

Scopus rating (2024): CiteScore 3.8 SJR 0.357 SNIP 0.807

Journal

Titles	IEEE design & test : D & T(2013 → …) IEEE design & test of computers : D & T(1984 → 2012) IEEE Design and Test
ISSNs	2168-2356, 0740-7475
Additional searchable ISSN (electronic)	1558-1918, 2168-2364
Publisher	IEEE Computer Society
Country/Territory	United States of America
ZDB-ID	2729075-X
ZDB-ID	2714080-5

Keywords

Sharon Hu, X., Lee, M. Y., Li, M., De Lima, J. P. C., Liu, L., Zhu, Z. & Castrillon, J. & 2 others, Niemier, M. & Wang, Y., Dec 2025, In: IEEE Design and Test. 42, 6, p. 75-86 12 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Lohana, A., Rupani, A., Rai, S. & Kumar, A., 2 Mar 2021, In: IEEE design & test of computers : D & T. 39, 3, p. 73-81 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review

Zeinolabedin, S. M. A., Partzsch, J. & Mayr, C., 2020, In: IEEE design & test : D & T. 38, 1, p. 69-77 9 p.

Research output: Contribution to journal › Research article › Contributed › peer-review