Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines
Activity: Talk or presentation at external institutions/events › Talk/Presentation › Contributed
Persons and affiliations
- Susann Rothe - , Chair of Development and Construction in Electromechanical and Electronic Design (Speaker)
Date
24 Apr 2023
Conference
| Title | 17th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics |
|---|---|
| Subtitle | Stress workshop |
| Abbreviated title | IRSP 2023 |
| Conference number | 17 |
| Duration | 24 - 26 April 2023 |
| Website | |
| Location | Hotel Elbresidenz |
| City | Bad Schandau |
| Country | Germany |