Using Monte Carlo Tree Search for EDA - A Case-study with Designing Cross-layer Reliability for Heterogeneous Embedded Systems.
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
Continued transistor scaling and increasing power density have led to considerable increase in fault-rates in silicon nanotechnology-based real-Time systems. Cross-layer fault tolerance techniques present a more cost-efficient methodology for adapting to such increased fault rates by distributing fault-Tolerance to different layers. To this end, we propose a methodology for integrating the design space exploration (DSE) for taskmapping on heterogeneous hardware-platforms with designing cross-layer reliability. Specifically, we model the DSE for task-mapping with cross-layer reliability as a tree search problem and use Monte Carlo Tree Search for task-mapping and scheduling applications with specific reliability requirements. The proposed methodology results in considerable improvements over a standalone approach to task-mapping and implementing cross-layer reliability.
Details
| Originalsprache | Englisch |
|---|---|
| Titel | Proceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021 |
| Seiten | 1-6 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9781665426145 |
| Publikationsstatus | Veröffentlicht - 2021 |
| Peer-Review-Status | Ja |
Externe IDs
| Scopus | 85117702954 |
|---|
Schlagworte
Forschungsprofillinien der TU Dresden
ASJC Scopus Sachgebiete
Schlagwörter
- Design Space Exploration, System-level Design, Cross-layer System Design, Embedded Systems, Randomized Algorithms, Reliability