Using Monte Carlo Tree Search for EDA - A Case-study with Designing Cross-layer Reliability for Heterogeneous Embedded Systems.

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Abstract

Continued transistor scaling and increasing power density have led to considerable increase in fault-rates in silicon nanotechnology-based real-Time systems. Cross-layer fault tolerance techniques present a more cost-efficient methodology for adapting to such increased fault rates by distributing fault-Tolerance to different layers. To this end, we propose a methodology for integrating the design space exploration (DSE) for taskmapping on heterogeneous hardware-platforms with designing cross-layer reliability. Specifically, we model the DSE for task-mapping with cross-layer reliability as a tree search problem and use Monte Carlo Tree Search for task-mapping and scheduling applications with specific reliability requirements. The proposed methodology results in considerable improvements over a standalone approach to task-mapping and implementing cross-layer reliability.

Details

OriginalspracheEnglisch
TitelProceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021
Seiten1-6
Seitenumfang6
ISBN (elektronisch)9781665426145
PublikationsstatusVeröffentlicht - 2021
Peer-Review-StatusJa

Externe IDs

Scopus 85117702954

Schlagworte

Forschungsprofillinien der TU Dresden

Schlagwörter

  • Design Space Exploration, System-level Design, Cross-layer System Design, Embedded Systems, Randomized Algorithms, Reliability