Numerical study on the influence of material models for tin-based solder alloys on reliability statements

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • R. Metasch - , Fraunhofer-Institut für Keramische Technologien und Systeme (Autor:in)
  • R. Schwerz - , Fraunhofer-Institut für Keramische Technologien und Systeme (Autor:in)
  • K. Meier - , Professur für Aufbau- und Verbindungstechnik der Elektronik (Autor:in)
  • M. Roellig - , Fraunhofer-Institut für Keramische Technologien und Systeme (Autor:in)

Abstract

This paper presents a comparison of three different material models, which are currently used to describe creep behaviour of solder alloys in thermo-mechanical use cases. The first model is the commonly utilized Garofalo approach. This approach is based on a hyperbolic-sine equation to describe the secondary (stationary) creep rates dependent on the mechanical stress in combination with the Arrhenius equation to consider temperature dependencies. The other two material models cover the primary and the secondary creep stage. Here, unified viscoplastic constitutive models initially proposed by Anand and Chaboché et al. are introduced. In the presented FEM study result comparison has been done for the accumulated solder joint strains of a SMT component exposed to thermal cycling. Subsequently, the influence on creep strain progression and service life time estimation has been investigated.

Details

OriginalspracheEnglisch
Titel2019 22nd European Microelectronics and Packaging Conference and Exhibition, EMPC 2019
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
ISBN (elektronisch)978-0-9568086-6-0
ISBN (Print)978-1-7281-6291-1
PublikationsstatusVeröffentlicht - 16 Sept. 2019
Peer-Review-StatusJa

Konferenz

Titel22nd European Microelectronics and Packaging Conference & Exhibition
KurztitelEMPC 2019
Veranstaltungsnummer22
Dauer16 - 19 September 2019
Webseite
BekanntheitsgradInternationale Veranstaltung
OrtPalazzo Dei Congressi
StadtPisa
LandItalien

Externe IDs

ORCID /0000-0001-9720-0727/work/212490087

Schlagworte

Schlagwörter

  • Anand, Creep, Electronics, Garofalo, Lead-free solder, Life-time, Primary, Secondary, Sinh, Stationary, Thermo-mechanical properties, Unified