Jerk and current limited flatness-based open loop control of foveation scanning electrostatic micromirrors

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

Abstract

This paper describes open loop control measures for performance improvements of electrostatic micromirrors in context with foveation scanning for 3D time-of-flight cameras. The generation of high accuracy scanning trajectories with scene dependent variable slope is realized by a flatness-based open loop control scheme. Previous flatness-based control solutions have shown unfavorable residual oscillations excited at slope reverse points and high drive currents at zero-crossing comb deflection due to square-root voltage law for electrostatic mirror control. Jerk limited trajectories are introduced for reduction of residual oscillations and their impact on scanning trajectory properties is expressed by design formulas. A considerable reduction of zero-crossing drive currents can be achieved by using a dual-comb control law at small deflection angles reducing the effective drive voltage slope. The paper addresses the basic micromirror models and describes in detail the jerk and current limitation control measures in context with the flatness-based control concept. Experimental results prove the adequacy of the proposed solutions.

Details

OriginalspracheEnglisch
Titel19th IFAC World Congress IFAC 2014, Proceedings
Redakteure/-innenEdward Boje, Xiaohua Xia
Herausgeber (Verlag)IFAC Secretariat
Seiten2685-2690
Seitenumfang6
ISBN (elektronisch)9783902823625
PublikationsstatusVeröffentlicht - 2014
Peer-Review-StatusJa

Publikationsreihe

ReiheIFAC Proceedings Volumes
Nummer3
Band47
ISSN1474-6670

Konferenz

Titel19th IFAC World Congress on International Federation of Automatic Control
KurztitelIFAC 2014
Veranstaltungsnummer19
Dauer24 - 29 August 2014
Webseite
BekanntheitsgradInternationale Veranstaltung
StadtCape Town
LandSüdafrika

Externe IDs

Scopus 84929832769
ORCID /0000-0003-3259-4571/work/142249664

Schlagworte

ASJC Scopus Sachgebiete

Schlagwörter

  • Mikrospiegel Optoelektronik