Exploring Standard-Cell Designs for Reconfigurable Nanotechnologies: A Formal Approach.

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Abstract

Standard-cell design has always been a craft, and common field-effect transistors
span only a small design space.
This has changed with reconfigurable transistors.
Boolean functions that exhibit multiple dual product-terms in their sum-of-product
form yield various beneficial circuit implementations with
reconfigurable transistors.
In this work, we present an approach to automatically generate these implementations
through a formal modeling approach.
Using the 3-input XOR function as an example, we discuss the variations and
show how to quantify properties like worst-case delay and power
dissipation, as well as averages of delay and energy consumption per operation
over different scenarios.
The quantification runs fully automated on charge transport network models
employing probabilistic model checking.
This yields exact results instead of approximations obtained from experiments and sampling.
The highlight of our work is that the proposed approach provides a comprehensive
early technology evaluation flow.

Details

OriginalspracheEnglisch
TitelProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Redakteure/-innenCristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu
Seiten23-28
Seitenumfang6
ISBN (elektronisch)9783981926361
PublikationsstatusVeröffentlicht - 2022
Peer-Review-StatusJa

Konferenz

Titel2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Dauer14 - 23 März 2022
StadtVirtual, Online
LandBelgien

Externe IDs

Scopus 85130816133

Schlagworte

Forschungsprofillinien der TU Dresden

Fächergruppen, Lehr- und Forschungsbereiche, Fachgebiete nach Destatis

Ziele für nachhaltige Entwicklung

Schlagwörter

  • Circuit analysis, Formal Verification, Nanoelectronics, Probabilistic model checking, Probability, Quantitative Analysis, Reconfigurable logic, Semiconductor device modeling, probabilistic model checking, reconfigurable logic, probability, formal verification, semiconductor device modeling, nanoelectronics, quantitative analysis