Electrostatic wafer handling for thin wafer processing

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • C. Landesberger - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • R. Wieland - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • A. Klumpp - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • P. Ramm - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • A. Drost - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • U. Schaber - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • D. Bonfert - , Fraunhofer Institute for Reliability and Microintegration (Autor:in)
  • K. Bock - , Professur für Aufbau- und Verbindungstechnik der Elektronik, Fraunhofer Institute for Reliability and Microintegration (Autor:in)

Abstract

Mobile electrostatic carriers, so called e-carriers, offer a new and promising technical solution for simple and reversible attachment of thin wafers onto support substrates. The paper reports on latest developments in manufacture of e-carriers based on silicon wafers with through substrate vias and backside contact pads. Thermal and electrical characterizations of e-carries have proven very low leakage currents at temperatures up to 300 °C. These new types of e-carriers enable long term electrostatic holding capabilities. It is also shown that electrical properties of transistor devices are not changed when CMOS wafers are attached onto e-carriers, neither in face up nor face down attachment configuration. Furthermore, the paper proposes a technical concept how electrostatic support technique can be used for thin wafer processing in wet-chemical environments. E-carriers can also be applied for reversibly bonding of single chip devices onto a carrier substrate. The paper explains how this feature can be used in chip to wafer stacking for 3d integrated systems.

Details

OriginalspracheEnglisch
Titel2009 European Microelectronics and Packaging Conference
ErscheinungsortRimini
Herausgeber (Verlag)IEEE Xplore
ISBN (elektronisch)978-0-6152-9868-9
ISBN (Print)978-1-4244-4722-0
PublikationsstatusVeröffentlicht - 2009
Peer-Review-StatusJa

Publikationsreihe

ReiheEuropean Microelectronics and Packaging Conference, EMPC

Konferenz

Titel2009 European Microelectronics and Packaging Conference, EMPC 2009
Dauer15 - 18 Juni 2009
StadtRimini
LandItalien

Externe IDs

ORCID /0000-0002-0757-3325/work/139064959

Schlagworte

ASJC Scopus Sachgebiete

Schlagwörter

  • Carrier substrates, E-carriers, Thin wafer technology, Ultra-thin wafer processing