Demonstration of 1T1C FeRAM Arrays for Nonvolatile Memory Applications
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Beitragende
Abstract
Over the past few years, concern over high-density and low-power embedded memories has risen for various applications, such as cache memory, Internet of Things (IoT), and in-memory computing. Traditional memories, such as embedded or external flash memories, are facing the challenge of scaling down beyond 28-nm technology due to high process costs resulting from complex structures. On the contrary, magnetoresistive random access memory (MRAM) has been receiving increased attention as it can be integrated in 22-nm technology. Resistive memory requires a high switching current during write or read operations, leading to high energy consumption. To control this consumption, dedicated access devices are necessary.
Details
Originalsprache | Englisch |
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Titel | 2021 20th International Workshop on Junction Technology (IWJT) |
Herausgeber (Verlag) | IEEE, New York [u. a.] |
ISBN (elektronisch) | 978-4-86348-779-6 |
ISBN (Print) | 978-1-6654-4887-1 |
Publikationsstatus | Veröffentlicht - 2021 |
Peer-Review-Status | Ja |
Publikationsreihe
Reihe | International Workshop on Junction Technology |
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Konferenz
Titel | 20th International Workshop on Junction Technology, IWJT 2021 |
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Dauer | 10 - 11 Juni 2021 |
Stadt | Virtual, Online |
Land | Japan |
Externe IDs
ORCID | /0000-0003-3814-0378/work/142256169 |
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