Stefan C. B. Mannsfeld states that development in organic electronics depends on the understanding of the structure-property relationships of organic materials. Resonant scattering of polarized soft X-rays (P-SoXS) by aromatic carbon bonds has been used to probe molecular orientation in thin organic semiconductor films down to length scales of 20 nm. The basic principle of the P-SoXS technique involves a polarized soft X-ray beam passing through a thin sample and the scattering signal and recorded by an X-ray sensitive detector. Soft X-rays are distinguished from hard X-rays by their lower photon energies, which fall into the same energy range as the fundamental electronic transitions of many lighter atoms, including carbon. The novelty of P-SoXS lies in the use of scattering with polarized soft X-rays whose energy is tuned to a fundamental carbon transition in aromatic carbon ring systems.