X-ray computed tomography

Research output: Contribution to book/Conference proceedings/Anthology/ReportChapter in book/Anthology/ReportContributedpeer-review

Contributors

Abstract

Computed tomography (CT) with X-rays is widely used in medicine and nondestructive testing today. However, in process applications, X-ray tomography has so far been more seldom used, obviously due to its high complexity and costs. Nonetheless, particularly in laboratory studies, it has frequently proven its superior capability to measure multiphase flow parameters, such as local phase fractions in pipes, vessels, or other process system components, with high resolution and accuracy. Most recently, different technologies were presented that allow faster tomographic imaging of flows with X-ray CT, which now opens the door for a wider application of this technique in process analysis, monitoring, and control. This chapter gives a concise overview of basic principles and hardware of X-ray CT, particularly with respect to process applications, and provides state-of-the-art examples of its application in multiphase flow analysis.

Details

Original languageEnglish
Title of host publicationIndustrial Tomography
PublisherElsevier
Chapter6
Pages207-229
Number of pages23
Edition2
ISBN (electronic)9780128230152
ISBN (print)9780128233078
Publication statusPublished - 1 Jan 2022
Peer-reviewedYes

Keywords

ASJC Scopus subject areas

Keywords

  • Cone-beam tomography, Electron beam tomography, X-ray detectors, X-ray sources, X-ray tomography