Verification of /spl pi/-equivalent circuit based microwave noise model on A/sub III/B/sub v/ HBTs with emphasis on HICUM

Research output: Contribution to book/Conference proceedings/Anthology/Report › Conference contribution › Contributed › peer-review

Contributors

  • J. Herricht - , Chair of Electron Devices and Integrated Circuits, TUD Dresden University of Technology, Structure and Materials Mechanics Research Institute at the Dresden University of Technology (SWM) (Author)
  • P. Sakalas - , Chair of Electron Devices and Integrated Circuits, Semiconductor Physics Institute Vilnus (Author)
  • M. Schroter - , University of California at Irvine (Author)
  • P. Zampardi - , Skyworks Solutions Inc. (Author)
  • Y. Zimmermann - , Chair of Electron Devices and Integrated Circuits, TUD Dresden University of Technology, Structure and Materials Mechanics Research Institute at the Dresden University of Technology (SWM) (Author)
  • F. Korndorfer - , Europe University Viadrina (Author)
  • A. Simukovic - , Semiconductor Physics Institute Vilnus (Author)

Abstract

Analytical noise model for bipolar transistors, based on /spl pi/-hybrid equivalent circuit is verified on A/sub III/B/sub v/ HBTs. Equivalent circuit model parameters are obtained from detailed analysis of HICUM compact model. Since, new analytical model enables the evaluation of noise parameters just using external de-embedded y-parameters, obtained noise parameters are compared to those simulated with HICUM, and to other well known analytical noise equations. Good agreement over a wide range of measured noise parameters proves the model validity for the investigated A/sub III/B/sub v/ HBTs and enables a correct extraction of noise delay time, which is associated with base and base/collector space charge region transit time and determines the correlation between base and collector current shot noise.

Details

Original languageGerman
Title of host publicationIEEE MTT-S International Microwave Symposium Digest, 2005.
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1419-1422
Number of pages4
ISBN (print)0-7803-8845-3
Publication statusPublished - 17 Jun 2005
Peer-reviewedYes

Conference

TitleIEEE MTT-S International Microwave Symposium Digest, 2005.
Duration17 June 2005
LocationLong Beach, CA, USA

External IDs

Scopus 33749257525

Keywords

Keywords

  • Microwave circuits, Circuit noise, Analytical models, Equivalent circuits, Bipolar transistors, Circuit simulation, Equations, Current measurement, Charge measurement, Noise measurement