The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of Topography

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • A. Pradhan - , University of Pittsburgh (Author)
  • M. H. Müser - , Saarland University (Author)
  • N. Miller - , University of Pittsburgh (Author)
  • J. P. Abdelnabe - , Universidad Nacional del Sur (Author)
  • L. Afferrante - , Polytechnic University of Bari (Author)
  • D. Albertini - , Lyon Institute Of Nanotechnology (Author)
  • D. A. Aldave - , Universidad Autónoma de Madrid (Author)
  • L. Algieri - , University of Salento (Author)
  • N. Ali - , University of Illinois at Urbana-Champaign (Author)
  • A. Almqvist - , Luleå University of Technology (Author)
  • T. Amann - , Fraunhofer Institute for Mechanics of Materials (Author)
  • P. Ares - , Universidad Autónoma de Madrid (Author)
  • B. N. Balzer - , University of Freiburg (Author)
  • L. Baugh - , Auburn University (Author)
  • E. A. Berberich - , Miami University (Author)
  • M. Björling - , Luleå University of Technology (Author)
  • M. S. Bobji - , Indian Institute of Science Bangalore (Author)
  • F. Bottiglione - , Polytechnic University of Bari (Author)
  • B. Brodmann - , OptoSurf GmbH (Author)
  • W. Cai - , Hefei University of Technology (Author)
  • G. Carbone - , Polytechnic University of Bari (Author)
  • R. W. Carpick - , University of Pennsylvania (Author)
  • F. Cassin - , University of Pittsburgh (Author)
  • J. Cayer-Barrioz - , Laboratoire de Tribologie et Dynamique des Systèmes (Author)
  • M. I. Chowdhury - , Lehigh University (Author)
  • M. Ciavarella - , Polytechnic University of Bari (Author)
  • E. Cihan - , Center for Advancing Electronics Dresden (cfaed), Single Molecule Machines (Junior Research Group) (cfaed) (Author)
  • D. Huang - , Saint-Gobain Performance Plastics (Author)
  • E. Delplanque - , Laboratoire de Tribologie et Dynamique des Systèmes (Author)
  • A. J. Deptula - , University of Illinois at Urbana-Champaign (Author)
  • S. Descartes - , French National Centre for Scientific Research (CNRS) (Author)
  • A. Dhinojwala - , University of Akron (Author)
  • M. Dienwiebel - , Fraunhofer Institute for Mechanics of Materials, Karlsruhe Institute of Technology (Author)
  • D. Dini - , Imperial College London (Author)
  • A. C. Dunn - , University of Florida (Author)
  • C. Edwards - , University of Texas at Austin (Author)
  • M. Eriten - , University of Wisconsin-Madison (Author)
  • A. Esawi - , American University in Cairo (Author)
  • R. M. Espinosa-Marzal - , University of Illinois at Urbana-Champaign (Author)
  • L. Fang - , University of Pennsylvania (Author)
  • A. Fatemi - , Robert Bosch GmbH (Author)
  • C. Fidd - , Florida State University (Author)
  • D. Gabriel - , Currenta GmbH & Co. OHG (Author)
  • F. Gaslain - , Ecole des Mines de Paris (Author)
  • G. Giordano - , Polytechnic University of Bari (Author)
  • J. Gómez-Herrero - , Universidad Autónoma de Madrid (Author)
  • L. Gontard - , BD Medical-Pharmaceutical Systems - Europe (Author)
  • N. N. Gosvami - , Indian Institute of Technology Delhi (IITD) (Author)
  • G. Greenwood - , University of Illinois at Urbana-Champaign (Author)
  • C. Greiner - , Karlsruhe Institute of Technology (Author)
  • T. Grejtak - , Oak Ridge National Laboratory (Author)
  • A. Haroun - , American University in Cairo (Author)
  • M. Hasan - , Luleå University of Technology (Author)
  • S. Hoppe - , Currenta GmbH & Co. OHG (Author)
  • L. Isa - , ETH Zurich (Author)
  • R. L. Jackson - , Auburn University (Author)
  • S. Jang - , Pennsylvania State University (Author)
  • O. Johnson - , University of Texas at Austin (Author)
  • F. Kaiser - , Freudenberg Technology Innovation SE & Co.KG (Author)
  • M. Kalin - , University of Ljubljana (Author)
  • K. Kalliorinne - , Luleå University of Technology (Author)
  • P. H. Karanjkar - , University of Akron (Author)
  • S. H. Kim - , Pennsylvania State University (Author)
  • S. Kinzelberger - , Fraunhofer Institute for Mechanics of Materials (Author)
  • P. Klapetek - , Czech Metrology Institute, Brno University of Technology (Author)
  • B. A. Krick - , Florida State University (Author)
  • C. Kumar - , University of Glasgow (Author)
  • N. Kumar - , Corning Incorporated (Author)
  • S. Kumar - , University of Akron (Author)
  • P. LaMascus - , University of Pennsylvania (Author)
  • R. Larsson - , Luleå University of Technology (Author)
  • P. Laux - , Fraunhofer Institute for Physical Measurement Techniques (Author)
  • M. J. Lee - , University of Illinois at Urbana-Champaign (Author)
  • P. M. Lee - , Southwest Research Institute (Author)
  • W. Lee - , University of Wisconsin-Madison (Author)
  • C. Leriche - , University of Amsterdam (Author)
  • J. Li - , University of Illinois at Urbana-Champaign (Author)
  • Y. Li - , Karlsruhe Institute of Technology (Author)
  • Y. S. Li - , Pennsylvania State University (Author)
  • T. A. Lubrecht - , French National Centre for Scientific Research (CNRS) (Author)
  • I. A. Lyashenko - , Technical University of Berlin, Samarkand State University (Author)
  • C. Ma - , University of Science and Technology of China (USTC), University of California at Santa Barbara (Author)
  • T. Ma - , Tsinghua University (Author)
  • F. Maaboudallah - , Université de Sherbrooke (Author)
  • S. Mahmood - , Auburn University (Author)
  • F. Mangolini - , University of Texas at Austin (Author)
  • M. Marian - , Pontificia Universidad Católica de Chile (Author)
  • D. Mazuyer - , Laboratoire de Tribologie et Dynamique des Systèmes (Author)
  • Y. Meng - , Tsinghua University (Author)
  • N. Menga - , Polytechnic University of Bari (Author)
  • T. Miller - , Freudenberg Technology Innovation SE & Co.KG (Author)
  • D. M. Mulvihill - , University of Glasgow (Author)
  • M. Najah - , Université de Sherbrooke (Author)
  • D. Nečas - , Brno University of Technology (Author)
  • C. I. Papadopoulos - , National Technical University of Athens (Author)
  • A. Papangelo - , Polytechnic University of Bari (Author)
  • M. Pauli - , Polytech GmbH (Author)
  • B. N.J. Persson - , Jülich Research Centre (Author)
  • A. Peterson - , University of Massachusetts Lowell (Author)
  • A. A. Pitenis - , University of California at Santa Barbara (Author)
  • P. Podsiadlo - , Curtin University (Author)
  • M. Polajnar - , University of Ljubljana (Author)
  • V. L. Popov - , Technical University of Berlin, Samarkand State University (Author)
  • T. Požar - , University of Ljubljana (Author)
  • A. Prasad - , University of Pittsburgh (Author)
  • G. Prieto - , Universidad Nacional del Sur (Author)
  • C. Putignano - , Polytechnic University of Bari (Author)
  • M. H. Rahman - , University of Illinois at Urbana-Champaign (Author)
  • S. B. Ramisetti - , Independent Researcher (Author)
  • S. Raumel - , Leibniz University Hannover (LUH) (Author)
  • I. J. Reyes - , Southwest Research Institute (Author)
  • N. Rodriguez - , BD Medical-Pharmaceutical Systems - United States (Author)
  • M. Rodríguez Ripoll - , Austrian Academy of Sciences (Author)
  • H. Rojacz - , Austrian Academy of Sciences (Author)
  • P. Sainsot - , French National Centre for Scientific Research (CNRS) (Author)
  • A. Samodurova - , University of Ljubljana (Author)
  • D. Savio - , Freudenberg Technology Innovation SE & Co.KG (Author)
  • M. Scaraggi - , University of Salento, Italian Institute of Technology (Author)
  • F. Schaefer - , Saarland University (Author)
  • S. W. Scherrer - , ETH Zurich (Author)
  • K. D. Schulze - , Auburn University (Author)
  • K. E. Shaffer - , University of California at Santa Barbara (Author)
  • M. A. Sidebottom - , Miami University (Author)
  • D. Skaltsas - , National Technical University of Athens (Author)
  • J. Soni - , Indian Institute of Technology Delhi (IITD) (Author)
  • C. Spies - , Robert Bosch GmbH, University of Freiburg (Author)
  • G. W. Stachowiak - , Curtin University (Author)
  • L. Steinhoff - , Leibniz University Hannover (LUH) (Author)
  • N. C. Strandwitz - , Lehigh University (Author)
  • K. Sun - , University of Illinois at Urbana-Champaign (Author)
  • S. Tripathi - , University of Massachusetts Lowell (Author)
  • W. R. Tuckart - , Universidad Nacional del Sur (Author)
  • S. Ugar - , Indian Institute of Science Bangalore (Author)
  • M. Valtr - , Czech Metrology Institute, Brno University of Technology (Author)
  • K. E. Van Meter - , Florida State University (Author)
  • J. Vdovak - , Robert Bosch GmbH (Author)
  • J. G. Vilhena - , Spanish National Research Council (CSIC) (Author)
  • G. Violano - , Polytechnic University of Bari (Author)
  • G. Vorlaufer - , Austrian Academy of Sciences (Author)
  • M. Walczak - , Pontificia Universidad Católica de Chile (Author)
  • B. Weber - , University of Amsterdam (Author)
  • T. Woloszynski - , Curtin University (Author)
  • M. Wolski - , Curtin University (Author)
  • A. Yadav - , CSIR - Central Salt Marine Chemicals Research Institute (Author)
  • V. A. Yastrebov - , Ecole des Mines de Paris (Author)
  • M. Yongjian - , University of Illinois at Urbana-Champaign (Author)
  • L. Yuan - , University of Pennsylvania (Author)
  • J. Yus - , University of Illinois at Urbana-Champaign (Author)
  • J. Zhang - , Imperial College London (Author)
  • X. Zhang - , University of Illinois at Urbana-Champaign (Author)
  • Q. Zheng - , University of Illinois at Urbana-Champaign (Author)
  • L. Pastewka - , University of Freiburg (Author)
  • T. D.B. Jacobs - , University of Pittsburgh (Author)

Abstract

Surface performance is critically influenced by topography in virtually all real-world applications. The current standard practice is to describe topography using one of a few industry-standard parameters. The most commonly reported number is Ra, the average absolute deviation of the height from the mean line (at some, not necessarily known or specified, lateral length scale). However, other parameters, particularly those that are scale-dependent, influence surface and interfacial properties; for example the local surface slope is critical for visual appearance, friction, and wear. The present Surface-Topography Challenge was launched to raise awareness for the need of a multi-scale description, but also to assess the reliability of different metrology techniques. In the resulting international collaborative effort, 153 scientists and engineers from 64 research groups and companies across 20 countries characterized statistically equivalent samples from two different surfaces: a “rough” and a “smooth” surface. The results of the 2088 measurements constitute the most comprehensive surface description ever compiled. We find wide disagreement across measurements and techniques when the lateral scale of the measurement is ignored. Consensus is established through scale-dependent parameters while removing data that violates an established resolution criterion and deviates from the majority measurements at each length scale. Our findings suggest best practices for characterizing and specifying topography. The public release of the accumulated data and presented analyses enables global reuse for further scientific investigation and benchmarking.

Details

Original languageEnglish
Article number110
Journal Tribology letters
Volume73
Issue number3
Publication statusPublished - 26 Jul 2025
Peer-reviewedYes

External IDs

ORCID /0000-0002-1747-3838/work/188860384
Scopus 105011641331

Keywords

Keywords

  • Challenge, Multi-scale topography, Open Science, Roughness metrics, Surface topography